Accelerating time-to-market and reducing the overall cost of test
Semiconductor manufacturers today are creating complex integrated circuits (ICs) of unprecedented size and functionality, straining traditional test methodologies. Despite the increasing complexity in ICs, manufacturers must continue to shorten test times, reduce the cost-of-test, and accelerate ramp-to-volume production.
With a long heritage in SoC and linear markets, and its newest lines being adopted by world-leading consumer manufacturers, Credence embraces the growing demand for thorough, accurate, and reliable test solutions at every stage of the development process. Providing customers critical information about actual device performance at first silicon, Credence's comprehensive product portfolio spans high-end SoC, mixed-signal, RF, and automotive test systems—all with a full suite of debug, validation, and characterization tools to significantly accelerate product introductions and reduce overall cost-of-test.
Phases of Device Verification
Engineering
Electrical functional test of first silicon to verify design intent, I/O characterization for margining, speed path analyses, performance optimization. Creation of production test program.
Wafer Sort
Electrical functional test of die in wafer form focuses on structural verification of the device.
Final Test
Electrical test of packaged devices for verifying mission mode functionality: speed grading, performance and speed binning, mission mode verification; verifying packaging integrity.
Device Diagnostics
Silicon level debug, circuit edit and failure analysis using electron, ion beam, emission microscopy technologies.
Product Finder
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ASL 1000
Cost-effective linear IC test system for engineering and production environments is ideal for testing Power Management, Graphics, Video, and Telecommunications IC devices |
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ASL 3000
High-throughput, mixed-signal IC production test system is ideal for testing Power Management, Graphics, Audio, Video, Telecommunications IC devices |
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ASL 3000RF
RF production test system for RF power amplifiers (PA), front end modules (FEM), RF transceivers, and general purpose centric devices |
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Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
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Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
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Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
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Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
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Devices We Test
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Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
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Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
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Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
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Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
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Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
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Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
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Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
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Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
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Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
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ASL 3000RF
RF production test system for RF power amplifiers (PA), front end modules (FEM), RF transceivers, and general purpose RF-centric devices |
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Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
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ASL 3000RF
RF production test system for RF power amplifiers (PA), front end modules (FEM), RF transceivers, and general purpose RF-centric devices |
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Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
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ASL 3000RF
RF production test system for RF power amplifiers (PA), front end modules (FEM), RF transceivers, and general purpose RF-centric devices |
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Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
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Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
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Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
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Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
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Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
|
Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
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Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
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Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
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Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
|
Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
|
Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
|
Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
|
Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
|
Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
|
Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
|
Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
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Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
|
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ASL 1000
Cost-effective linear IC test system for engineering and production environments is ideal for testing Power Management, Analog, Sensors, Discretes |
|
ASL 3000
High-throughput, mixed-signal IC production test system is ideal for testing Power Management, Graphics, Audio, Video, Telecommunications IC devices |
|
Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
|
Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
|
Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
|
ASL 1000
Cost-effective linear IC test system for engineering and production environments is ideal for testing Power Management, Analog, Sensors, Discretes |
|
ASL 3000
High-throughput, mixed-signal IC production test system is ideal for testing Power Management, Graphics, Audio, Video, Telecommunications IC devices |
|
Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
|
Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
|
Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
|
ASL 1000
Cost-effective linear IC test system for engineering and production environments is ideal for testing Power Management, Analog, Sensors, Discretes |
|
ASL 3000
High-throughput, mixed-signal IC production test system is ideal for testing Power Management, Graphics, Audio, Video, Telecommunications IC devices |
|
Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
|
Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
|
Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
|
ASL 1000
Cost-effective linear IC test system for engineering and production environments is ideal for testing Power Management, Analog, Sensors, Discretes |
|
ASL 3000
High-throughput, mixed-signal IC production test system is ideal for testing Power Management, Graphics, Audio, Video, Telecommunications IC devices |
|
Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
|
Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
|
Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
|
ASL 1000
Cost-effective linear IC test system for engineering and production environments is ideal for testing Power Management, Analog, Sensors, Discretes |
|
ASL 3000
High-throughput, mixed-signal IC production test system is ideal for testing Power Management, Graphics, Audio, Video, Telecommunications IC devices |
|
Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
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Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
|
Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
|
Falcon
Analog/power mixed-signal IC test system for automotive, advanced analog and power applications. Ideal for multi-site IC testing of automotive, advanced analog and power, data converters, sensors |
|
Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
|
Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
|
Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
|
Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
|
Diamond 10
IC test system for engineering, wafer sort, and final test environments. Ideal for testing very cost-sensitive consumer IC devices such as wireless baseband ICs, microcontrollers, display controllers, and general purpose ASIC devices used in popular consumer electronics products. |
|
Diamond 40
Multi-site production IC test system. Ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SiP devices, Bluetooth™ ICs, and integrated wireless transceivers used in popular consumer electronic products. |
|
Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
|
Sapphire
IC test system designed for production, engineered for characterization. Is ideal for testing high-speed IC devices: MPUs, GPUs, chipsets, high-performance digital—or mixed-signal—system chips. |
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