Contact Us  |  Technical Library  |  Search    
Services supportServices support

Diamond Series Mixed Signal (MultiWave) Applications - COURSE #0930

Register Now

 

 

Course Length

3 Days

Applicable Testers

Diamond Series Testers

Course Description

During this class the student will be introduced to tools the Diamond Series test system provides to perform mixed signal testing.  Typical applications include DACs/ACDs/Filters and voltage regulators. This is achieved through a combination of lecture, lab and exercise materials.  The class will cover the DIBU, VIS16 and MultiWave instruments in their mixed signal sections as well as sampling theory and Analog Waveform Tool (AWT).  Upon completion of the class students will be able to develop and debug programs for mixed signal IC’s using Diamond Series test systems.

Prerequisites

Successful completion of Diamond Series Basic Applications Course #0900
A good understanding of mixed signal testing

Recommended

  • C or C++ programming
  • Familiarity with Unix or Linux operating system
  • English - written and spoken

Related Classes

  • Diamond Series Basic Applications - Course #0900
  • Diamond Series APG Applications - Course #0905
  • Diamond Series RF and Baseband Applications - Course #0940
  • Diamond Series Basic Maintenance - Course #0920

Course Content

Mixed Signal Help Resources
Hardware Overview including:

  • Systems (Diamond 10 and Diamond 40)
  • Instruments utilized for Mixed Signal Applications (DD1096-16, VIS 16, VIS 2, DPS 16, DIBU and MultiWave)

Software Overview, including:

  • Linux OS and Diamond Directory Structure
  • Test Programming environment
  • Integrated Test Environment (ITE)
  • Operator Interface Control Tool
  • DSP Library
  • AWT Lab exercise

Defining Mixed Signal Resources and Signals:

  • Tester Resources
  • Mapping Signals
  • Defining STIL Signals and SignalGroups

DIBU use for Mixed Signal Tests including:

  • DIBU Overview
  • Programming the DIBU
  • Using the DIBU in debug

Utilization of the MultiWave instrument:

  • Arbitrary Waveform Generator
  • Waveform Digitizer
  • High Precision Audio/Video Generator Paths
  • High Precision Audio/Video Digitizer Path
  • Resource Definition
  • Signal Mapping
  • Overview of AWG and Digitizer programming
  • Programming Clocks
  • Debugging tests

Utilization of the VIS16 Instrument:

  • Hardware Overview
  • Resource Definition
  • Signal Mapping
  • Debugging tests using Visualize Tool
  • Debugging tests using Shmoo and Margin Tool

Triggering Methods
Digital Source and Capture in Mixed Signal Testing:

  • How to source digital data with DD1096
  • Features of the Digital Capture memory

DAC Testing

  • Analog Waveform Capture
  • DAC Testing Using a Digitizer
  • Sampling Theory

ADC Testing

  • Waveform Generation
  • ADC Testing Using an Analog Source

Advanced Sampling