Sapphire
An IC test system designed for production, engineered for characterization

• Engineered for unlimited configurability with lowest cost of test. The Sapphire system you buy today has just the functionality you need: analog, digital, and mixed signal performance, pin count, and power. Insert different instruments as you need them. Sapphire delivers on the promise of a single platform for engineering and production, for structural and functional test strategies at wafer sort and final test for even the most complex, high speed ICs.
• No expensive backplanes. Plug any test instrument into any test head slot. And each test instrument - digital or analog - has all test resources on-board, including timing, memory, PMU, and DC power.

  
  (Digital, Analog, Power Supplies, Test Head Interface)

• Performance, pin count, power. Performance - Digital instruments range from 200 Mbps to multi-gigahertz. Dynamically configurable, multi-channel analog options cover 24-bit audio to 14-bit broadband video and beyond. Pin Count -Without a backplane, conventional pin count limits no longer apply. The universal slot framework accommodates devices with the largest pin counts, and large site-count multi-site test applications. Power - Even the device power supplies provide high flexibility. Multiple channels on a single instrument provide the parallel test capability required for multi-site test and can be ganged to provide the higher currents required for testing more complex SoCs. For even higher performance MPU and chipset devices, the 125 Amp device power supplies are designed to be ganged together to provide up to 375 Amps of current with superb di/dt performance characteristics.
• XTOS Software. Our XTOS software simplifies program development and debug, providing PC and Windows-based GUI tools in an ATE environment. It interfaces easily to popular 3rd party products. It uses the STIL-1999 standard to bridge the gap between EDA and ATE, bringing IC design and test closer than ever before. Java-based test templates and XML test blocks provide a unique level of test program independence from the underlying operating system and form the basis of a truly extendable, plug-and-play software architecture.

• Compact system footprint with scalable performance, from DFT to multi-gigahertz
• Unprecedented benchmark in cost-effectiveness
• Modular architecture that maximizes capital flexibility
• Field reconfigurable high-throughput digital and mixed-signal instrumentation
• Designed-in advanced DFT capabilities
• Windows®-based, multi-threaded software for parallel and concurrent test strategies
• Cost-effective multi-channel mixed-signal instrumentation for multi-site testing
• High resolution, high accuracy Tester-per-InstrumentTM architecture
• World-class performance device power supplies ranging from 1 Amp to 375 Amps
• Architected to provide maximum throughput in multi-site mixed-signal testing

Analog   Mixed Signal   Digital   RF

D6432DFT

D2064

D4032

D4064

D3208

D6408

D6436

QBIX

GBS

Giga Xource5

6A DPS

125A DPS

GPVI

D-6432DFT

Debug. Characterization. Production Test. The D-6432DFT instrument is the first integrated test solution for high-speed serial buses to combine at-speed loopback testing with jitter measurement and injection—along with scan/functional tests and DC parametrics—all in a single insertion. Innovative far-end loopback methodology with programmable signal degradation makes production-level testing of PCI Express, HyperTransport and other high-speed serial buses up to 6.4 Gbps viable for the first time.

  Download Datasheet (PDF)

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D-2064

Debug. Characterization. Production Test. The D-2064 instrument delivers unsurpassed cost-effective digital test capability with data rates up to 400 Mbps and up to 64 I/O pins, independent time domain per instrument, integrated time measurement unit (TMU), PMU per pin, "system" PMU and a unique Sea of Memory pattern management. Additionally, the D-2064 can be economically field upgraded to 800 Mbps when higher test rates are needed.

  Download Datasheet (PDF)

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D-4032

Debug. Characterization. Production Test. The D-4032 instrument offers cost-effective digital test performance for SoC devices. It features flexible and advanced digital test capability with data rates up to 800 Mbps and up to 32 I/O pins, independent time domain per instrument, integrated Time Measurement Unit (TMU), system PMU and a unique Sea of Memory pattern management.

  Download Datasheet (PDF)

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D-4064

Debug. Characterization. Production Test. The D-4064 digital instrument establishes a new benchmark in cost-effective SoC test with data rates up to 800 Mbps and 64 bi-directional channels per card. It offers high throughput and independent time domain per instrument, integrated Time Measurement Unit (TMU), system PMU and a unique Sea of Memory pattern management that can be configured with 16 Gigabits of pattern memory for the instrument.

  Download Datasheet (PDF)

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D-3208

Debug. Characterization. Production Test. The D-3208 digital instrument is a high-accuracy test solution at 3.2 Gbps for differential high-speed, source synchronous, or clock-embedded buses. The D-3208 delivers unprecedented flexibility and advanced capabilities for testing high-speed interfaces at gigabit rates such as HyperTransport 2.0, DVI, and HDMI and with the Protocol Based Instrument (PBI) extensions, the D-3208 is equally adept at testing embedded clock serial buses like SATA, XAUI, Sonet, FBDIMM, and PCI Express.

  Download Datasheet (PDF)

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D-6408

Debug. Characterization. Production Test. A 6.4 Gbps IC digital test instrument that supports differential pins with high-accuracy serial edge placement. The D-6408 features source synchronous operation, tri-level signaling and protocol functions. The D-6408 offers fully differential inputs and outputs for 6.4 Gbps operation. With the patented Sequencer-per-Pin¨ timing flexibility and edge placement accuracy across all pins of ±20 ps, the D-6408 provides unsurpassed clock-forwarded source synchronous operation and traditional parallel bus capabilities. D-6408 provides tools for testing popular serial interfaces such as PCI Express I and II, XAUI, FB-DIMM, S-ATA and HyperTransport. For characterization, the D-6408 delivers accuracy and repeatability for excellent throughput and correlation.

  Download Datasheet (PDF)

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D-6436

Debug. Characterization. Production Test. High channel-density 6.4Gbps instrument for functional test of high-speed buses. With deep acquisition memories behind each pin, the D-6436 for Sapphire is the industry's most cost effective solution for silicon debug & validation of devices containing high-speed buses with data rates up to 6.4 Gbps.

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QBIX

Debug. Characterization. Production Test. The QBIX instrument provides bi-directional (source or measure), mixed-signal I/O for multi-site test. It features four fully independent analog channels, each configurable on-the-fly as a source or measure resource, independently selectable for high accuracy or high frequency requirements. This unique capability makes QBIX extremely cost-effective as it replaces the need for multiple instruments to cover the span of applications and multi-site test.

  Download Datasheet (PDF)

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10 GHz Gigabit sampler (GBS)

Debug. Characterization. Production Test. The 10 GHz GigaBit Sampler (GBS) is an ultra-high bandwidth digitizer for high-speed SoC applications. The GBS transforms Sapphire into a 10 GHz BW digital oscilloscope, capable of characterizing the most complex, high-speed ICs. In a production environment, the GBS combines the most accurate production jitter and template testing with proven test time advantages.

  Download Datasheet (PDF)

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GigaXource5

Characterization. Production Test. GigaXource5 is an ultra-high-speed arbitrary waveform generator with four independent differential outputs to source high-quality signals. The Credence GigaXource5 analog instrument for Sapphire delivers unprecedented flexibility and capability for testing SoC devices that have high-performance analog to digital converters or multi-level signal I/O cells. The GigaXource5 features four independent sources to cost-effectively solve difficult test challenges such as cross talk, multiple receivers, or functional test of disk drive analog front ends.

  Download Datasheet (PDF)

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Eight-channel 6 Amp Device Power Supply (DPS)

Debug. Characterization. Production Test. Our eight channel 6-Amp device power supply is ideally suited to multi-site test and DFT strategies. It can be used in any test head slot and offers modular, advanced power supply technology, providing from 6 A to 40 A.

  Download Datasheet (PDF)

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125 Amp Device Power Supply (DPS)

Debug. Characterization. Production Test. The 125-Amp Device Power Supply (DPS) is a high-performance, high-current power supply for functional and structural test of MPUs and advanced high performance chipsets. The DPS delivers world-class transient performance and voltage accuracy, and is capable of sourcing 125 A (250 A, or 375 A in gang mode).

  Download Datasheet (PDF)

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General Purpose voltage current instrument (GPVI)

Production Test. The GPVI is a high-performance, multiple channel voltage and current instrument for testing mixed-signal SoC devices. It delivers world-class DC instrument performance with 24 independent channels, multiple voltage and current ranges, source and measure capability, and the ability to be placed in any test head slot. With 24 independent channels in one instrument, the Sapphire capabilities for large scale multi-site testing are endless. Advanced capabilities such as channel ganging, modulation, pattern synchronization, and Kelvin sensing address a wide range of low-power SoC test requirements.

  Download Datasheet (PDF)

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