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ASL 1000
Cost-effective linear IC test system for engineering and production environments

Ideal for testing Power Management, Analog, Sensors, Discrete IC devices.


The popular ASL 1000™ is a linear test platform that supports up to 21 instruments in a fully configured system.

The ASL 1000 has the smallest footprint in its class. It is air-cooled and uses a standard 110V or 220V outlet. Its small test head makes docking easy.

The ASL 1000 is extremely adaptable and easily shared between engineering labs--where it is a cost-effective desktop test system--and in full production test environments where it proves its low total cost of ownership on a daily basis.

 

 

  • Multi-site: The ASL 1000 supports up to 256 sites. With twenty-one slots in the test head, swiftly upgrade from single to multi-site simply by adding multi-channel instrument cards with independent source and measure capabilities. There is no need to upgrade the system itself.
  • Shorter development and debug: VisualISE™, our graphical debug environment shortens test program development and debug with real-time analysis tools.
  • Easily moves between laboratories and test environments: The ASL 1000 has the smallest footprint in its class. It is air-cooled, minimizing HVAC requirements, and uses a standard 110V or 220V outlet. The small test head makes docking easy.
  • High throughput architecture: The ASL 1000 has the fastest test times in the market.
  • Lowest total cost of ownership: Our broad range of optional instruments allows you to customize and configure the system for the specific devices you test. You only pay for what you need. Fast test times and high throughput mean high volume production testing at a very low cost.
  • Repeatability Our design keeps the instruments as close to the device as possible: in the test head. All optional instruments have their own source and measurement units, making calibration and operation simple.
  • Twenty-one slots for linear instrumentation
  • Capable of supporting 256 sites
  • VisualISE™ - A graphical debug environment with templates that shorten test program development and debug
  • Visual ATE™ - A programming environment based on the Windows NT™ and XP™ operating system combines the advantages of template-driven programming with the fine control of procedural compiled commands. Automated inline QA sampling allows QA sampling during wafer sort or final testing.
  • Smallest footprint in its class
  • High throughput architecture
  • Full function manipulator: wafer level test-to-final test configurations
Analog   Mixed Signal   Digital   RF
DVI-2000
OV12
MUX          
TMU          
DDD8                
DCC                
MDI      
DOAL              
LCB              
HVS            
MVS              
OFS              
PV3          
QMVI            
ACS          
AWG            
AVD            
BB4-30            
MVNA
RF16
         

DVI-2000 Dual Voltage/Current Source (DVI)

Debug, Characterization. The DVI-2000 is ideal for measurement applications such as supply and ground current, and continuity, leakage, line, and load regulation. The DVI-2000 is a two-channel voltage and current source with low drift and four-quadrant capabilities. The two channels per card provide full Kelvin connections. Each channel can operate independently or can be used together to provide differential measurements. In differential meter mode, access to extremely low voltage ranges enables precise voltage measurements. Several voltage and current ranges are available, maintaining high accuracy throughout the complete instrument range. The accuracy and quick settling times of the DVI enhance fast test times.

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Octal/Voltage Current Source (OVI 2)

Production Test. The Octal/Voltage Current Source is an eight-channel, four-quadrant low drift voltage and current source. It has eight autonomous channels per card with full Kelvin connections. Several voltage and current ranges sustain instrument accuracy across its full power band. The OVI2 can supply ±20 V at 30 mA on all channels simultaneously. The OVI2 also has alarm and fault logic.

  Download Datasheet (PDF)


Multiplexer (MUX)

Production Test. All of our ASL Series instruments can be routed through our 32 relay Multiplexer, optimizing connectivity for any measurement. The MUX has eight banks of relays with four relays per bank. Connect banks to adjacent banks, to system ground, or to a user bus. The relays are commonly used to switch in DUT loads or external circuitry.

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Time Measurement Unit (TMU)

Production Test. The Time Measurement Unit (TMU) is a general purpose instrument that measures time and event-related parameters such as rise time, fall time, and duty cycle. The instrument has programmable start, stop, and enable inputs that provide great flexibility for measuring analog and digital signals over a wide input level range and bandwidth.

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Dynamic Digital Driver (DDD8)

Production Test. The Dynamic Digital Driver is an eight-channel digital I/O card. It provides cost-effective test coverage for elementary mixed-signal applications. The DDD8 generates period and timing edges with fundamental edge placement. The convenient onboard memory can store multiple patterns. Simple pattern control allows the user to start, stop, and loop clock pattern data. The DDD8 facilitates coherent testing by providing external triggers and clocks to other tester resources, such as the ACS and DIG5.

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DATA CONVERTER CARD (DCC)

The Data Converter Card (DCC) tests two types of converters: analog-to-digital (ADC) and digital-to-analog (DAC). The DCC features a 16-bit measurement system that allows measurements to be taken on voltage in (Vin), current in (Iin), and contact DUT input pins.

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MODULAR DIGITAL INSTRUMENT (MDI)

Production Test. The Credence Modular Digital Instrument (MDI) is a high-performance digital subsystem. The MDI employs an innovative sequencer-per-site architecture that enables true parallel testing with unsurpassed throughput. It has features to handle even the most complex testing challenges: on-the-fly period and timeset switching, sequencer instruction per vector, simultaneous fail and data capture, mixed-signal synchronization, and a built-in timing measurement unit.

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DUAL OP AMP LOOP (DOAL)

The Dual Op Amp Loop is an application-specific instrument designed to test operational amplifiers and comparators.

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LCB

Octal Low Leakeage measurement unit. Ranges from 100pA to 10nA.

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HIGH VOLTAGE SOURCE (HVS)

The High Voltage Source (HVS) instrument is a programmable high-voltage, low-current floating source.

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MEDIUM-VOLTAGE SOURCE (MVS)

The Medium-Voltage Source is a medium-voltage, medium-current floating source instrument.

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OCTAL FLOATING SOURCE (OFS)

The Octal Floating Source is a low-voltage, high-current floating source.

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PULSED VOLTAGE / CURRENT SOURCE (PV3)

The Pulsed Voltage / Current instrument is able to generate up to 100 A pulses.

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QMVI

Quad Medium Voltage Current Source. 4 channel, 300V and 50mA voltage and current source.

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ALTERNATING CURRENT SOURCE (ACS)

Debug, characterization. The Alternating Current Source (ACS) is a versatile arbitrary waveform generator. Sine wave, square wave, ramp and multi-tone waveforms can be produced. The ACS is suitable for device parameters such as PSRR, CMRR, gain; for time domain tests such as signal delay or slew rate; and for frequency domain tests such as THD and SNR. An array of onboard filtering provides signal conditioning and the ACS also has an RMS meter with numerous inputs and ranges. Triggering capability enables synchronization and the external clock input enables coherent AC measurements.

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BASEBAND ALTERNATING WAVE GENERATOR (BBAWG)

Base Band Waveform Generator and Digitizer. Waveform source and digitizer for differential I/Q base band applications.

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AUDIO VIDEO DIGITIZER (AVD)

Audio Video Digitizer. Digitizer for high resolution audio and video applications.

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BB4-30

Base Band Waveform Generator and Digitizer. Waveform source and digitizer for differential I/Q base band applications.

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MVNA RF16

Credence's RF measurement option for the Diamond 40 includes 16 ports along with an integrated per-receiver DSP architecture that delivers fast test times in multi-site applications with full RF test capabilities for a wide range of wireless devices up to 6 GHz in frequency. When combined with various digital, mixed-signal, and analog instrument options, the MVNA RF measurement option allows the testing of highly integrated mobile phone devices and the anticipated single chip cell phone.

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