In the News
January 31, 2008– Evaluation Engineering, Manager's Forum
Managing Effective Teams in a Global Environment
December 6, 2007– Test & Measurement World
Credence expands Diamond platform to offer multisite mixed-signal test
December 5, 2007 - EDN
Credence mixed-signal test expansion telegraphs SoC directions
August 30, 2007 - VLSI Research
New Visions for Credence (video clip)
August 9, 2007 - EDN
Design Intent, Life-cycle Costs, SoCs and BOST: A Lurking Train-wreck
July 19, 2007 - EE Times
When Intel speaks, do chip test execs listen?
July 18, 2007 - TMCNet
Credence Helps Semiconductor Manufacturers Meet Rising Demand for Faster Data Rates With Sapphire D-6432DFT Test Solution
July 12, 2007 - TMCNet
Editors Choice Best Product Awards – Semiconductor International
July 10, 2007 - Test & Measurement World
Intel’s Seth urges proactive test investment
July 10, 2007 - CNN News
Credence Sapphire platform wins Semiconductor International 2007 Editors’ Choice Best Product Award
July 1, 2007 - Semiconductor International
2007 Editors’ Choice Best Product Awards
July 1, 2007 - Test & Measurement World
Fixed-mobile convergence imposes test challenges
July 2007 - Evaluation Engineering
Advances in Test Program Automation
June 30, 2007 - Semiconductor International
Test Must Keep Pace with Consumer Devices, Chetan Desai (audio file)
Transcript
june 4, 2007 - Semiconductor International
ELMOS Selects FALCON Series From Credence to Test Semiconductors for Automotive Devices; High Precision Mixed Signal Technology and Multi-site Capability Enable Cost-Effective and Comprehensive Testing from Design through Debug and Production
April 20, 2007 - Test & Measurement World
Brady named Credence senior VP of engineering
March 2007 - Evaluation Engineering
Test Challenges for Transceivers Evaluation Engineering
March 30, 2007 - Test & Measurement World
Wavecrest SIA-3100 integrated with Credence ASL 1000 Test & Measurement World
December 7, 2006 - Test & Measurement World
Lev appointed Credence Systems CEO Test & Measurement World
December 1, 2006 - Test & Measurement World
ATE adapts to meet SOC test needs Test & Measurement World
October 1-15, 2006 - EE Times Asia
Revolutionize automated test equipment Electronic Enginerring Times-Asia
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